NEAR-FIELD IMAGING OF THE MICROWAVE DIELECTRIC PROPERTIES OF SINGLE-CRYSTAL PbTiO3 AND THIN-FILM Sr1 xBaxTiO3

A PbTiO3 crystal and Sr1 xBaxTiO3 lms have been studied by neareld scanning microwave microscopy (SMM). In the PbTiO3 crystal, dielectric properties and topography are obtained simultaneously. In Sr1 xBaxTiO3 lms, local variations and sample-to-sample di erences are observed. To quantitatively determine local dielectric permittivity and loss, we also carry out theoretical calculations on dependence of resonant frequency and quality factor on dielectric constants of bulk samples and thin lms. Good agreements between experimental and theoretical results are obtained.